Instrument: JEOL JEM-2100F Transmission Electron Microscope


Microscopy and Imaging


SB 62A Benedum

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This HR-TEM combine the capabilities for routine atomic resolution imaging of crystal lattices by coherent electron scattering or phase contrast (TEM) and incoherent electron scattering or Z-contrast in the scanning transmission electron microscopy (STEM) mode. It is equipped with attachments for XEDS analysis and a GIF TRIDIEM post-column energy filter for acquisition of energy-filtered images and diffraction.