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JEOL JSM-6390LV Scanning Electron Microscope

SRSS laboratory equipment
JEOL JSM-6390LV Scanning Electron Microscope

Details

This tungsten filament SEM utilizes a tilting and rotating mechanical stage.  It incorporates low vacuum back-scattered electron imaging for acquisition of high-resolution images of non-conductive, unprocessed samples.

Type

Microscopy and Imaging

Facility

Microscopy and Imaging Suite

101C Langley Hall