Director, Materials Characterization Lab
The Dimension 3100/IIIA atomic force microscope (AFM) is used for general topography imaging applications, most commonly in tapping mode. A conductivity module and external lock-in amplifier are available for CAFM measurements. Maximum scan areas are 90x90 um operating as a closed loop scanner. The microscope has been upgraded with a dual phase Quadrex phaseimaging extender module. A sealed liquids cell is available for imaging in controlled environments or in liquid.